Development of an Intelligent Fault Diagnosis Tool for iPhone Motherboards: Power Consumption Analysis Using Deep Learning
P.D.K. Madhubhashana, H.D.N.V. Jayasekara, G.D.G.N. Jayawardena, B.N.S. Lankasena, B.M. Seneviratne
Advances in Artificial Intelligence and Machine Learning (OAJAI&ML), Vol. 5(2), pp. 3784-3808 • 2025
DOI: 10.54364/AAIML.2025.52215
Abstract
This study presents an intelligent microcontroller-based diagnostic tool and application designed to enhance fault detection accuracy and efficiency in iPhone motherboards, utilizing power consumption data and deep learning for real-time diagnostics. The tool, deployed in phone repair centers, has generated a comprehensive dataset of over 1,600 iPhone 6s devices with faults linked to 12 distinct power rails.
Key Highlights
- Power profile analysis during boot and operational states
- LSTM-based fault classification model trained on real-world data (99% accuracy)
- Diagnostic accuracy surpassing traditional fault detection methods
- Dataset of 1,600+ iPhone 6s devices across 12 power rails
- RP2040 microcontroller with INA226 current sensor integration
- Potential applications in advanced mobile repair labs and refurbishing industries
